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United States Patent 5,835,403
Forbes Nov. 10, 1998

Multiplication of storage capacitance in memory cells by using the Miller effect


A memory cell for a dynamic random access memory includes a storage transistor that is connected for operation as an amplifier, the drain-to-gate capacitance of the storage transistor functioning as the storage capacitance for the memory cell. An access transistor is interposed between a bit line and the input of the amplifier, for coupling the amplifier to the bit line during write and read operations for the memory cell. During memory cell read operations, the storage capacitance is effectively multiplied by 1+Av, where Av is the gain of the amplifier, providing Miller-effect amplification of the storage capacitance.

Inventors: Forbes; Leonard (Corvallis, OR).
Assignee: Micron Technology, Inc. (Boise, ID).
Appl. No.: 879,908
Filed: Jun. 20, 1997

Related U.S. Application Data
Continuation of (including streamline cont.) Ser. No. 706,662, Sept. 6, 1996, Pat. No. 5,666,306.
Intl. Cl. : G11C 11/24
Current U.S. Cl.: 365/149; 365/203
Field of Search: 365/149, 203

References Cited | [Referenced By]

U.S. Patent Documents
4,970,689Nov., 1990Kenney 365/189.01
4,999,811Mar., 1991Banerjee 365/149
5,066,607Nov., 1991Banerjee 437/52
5,220,530Jun., 1993Itoh 365/189.01
5,448,513Sept., 1995Hu et al. 365/150
5,483,482Jan., 1996Yamada et al. 365/149
5,684,735Nov., 1997Kim 365/149

Other References

Cottrell, P., et al., "N-Well Design for Trench DRAM Arrays", IEEE, Abstract of Int. Electron Device Meeting, pp. 584-587, (1988).

Ema, T., et al., "3-Dimensional Stacked Capacitor Cell for 16M and 64M DRAMs", IEDM, Abstract of Int. Electron Device Meeting, pp. 592-595, (1988).

Mize, J.P., et al., "Semiconductor Memory Design and Applications", McGraw-Hill New York, pp. 115-138, (1973).

Primary Examiner: Dinh; Son T.
Attorney, Agent or Firm: Schwegman, Lundberg, Woessner & Kluth, P.A.
13 Claims, 5 Drawing Figures

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